| 4:00 p.m. | NAM | J-1 | EVALUATION OF ADHESIVE-ADHEREND INTERLAYERS BY MEANS OF ACOUSTIC MICROSCOPY
| P. Zinin1, B.D. Zeller, G.A.D. Briggs1, G.E. Thompson3, I. Goldfarb1, O.Lefeuvre1, A.J. Kinloch2 and P. Cawley2 1 Dept Materials, University of Oxford , Oxford, OX1 3PH, England |
|---|---|---|---|---|
| 4:15 p.m. | NAM | J-2 | Quantitative Acoustic Microcopy of Plastics Using Low Speed Coupling Fluids
| V.S. Ardebili, A.N. Sinclair, and J.K. Spelt, Mechanical Engr., Univ. of Toronto, Toronto, Canada |
| 4:30 p.m. | NAM | J-3 | A NEW VERSION OF LINE-FOCUS-BEAM ULTRASONIC MATERIAL CHARACTERIZATION SYSTEM
| J. Kushibiki, Y. Ono, and N. Chubachi, Department of Electrical Engineering, Tohoku University, Sendai 980, Japan |
| 4:45 p.m. | NMC | J-4 | SAW VELOCITY MEASUREMENT IN NANOMETER REGIONS BY SCANNING ACOUSTIC FORCE MICROSCOPY
| T. Hesjedal, E. Chilla, and H.-J. Frohlich, Paul-Drude-Institut fur Festkorperelektronik, Abteilung Festkorperakustik, D-10117 Berlin, Germany |
| 5:00 p.m. | INV | J-5 | Acoustical Imaging with Nanometer Resolution Using Atomic Force Microscopy
| W. Arnold, Fraunhofer Inst. for Nondestructive Testing (IZFP), Saarbrucken, Germany |
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