Session S

Session S: NDE - Spectral Processing

Chair: E. Furgason, Purdue University
Chula Vista, 11:00 a.m. - 12:30 p.m., Tuesday, November 5 ,1996, Hyatt Regency Hotel.

11:00 a.m. NSP S-1 Performance Comparison of Time-Frequency Distributions for Ultrasonic Nondestructive Testing
M.A. Malik* and J. Saniee, Elect. and Computer Engr. Dept., Illinois Institute of Technology, Chicago, IL, *De Vry Inst. of Technology, Chicago, IL

11:15 a.m. NMC S-2 WAVELET IMAGE PROCESSING FOR WEAR AND EROSION MAPPING USING AN ULTRASONIC GAUGING TECHNIQUE
A. Abbate1 and J. Frankel1, Robert W. Reed2 and P. Das3 1 U.S. Army Tank-Automotive Armaments Command, Benet Laboratories, Watervliet, NY, 2 Physics Dept., East Stroudsburg University, PA, 3 RPI, NY

11:30 a.m. NSP S-3 Statistical Analysis of Split Spectrum Processing
Q. Tian and N. Bilgutay, ECE Dept., Drexel Univ., Philadelphia, PA

11:45 a.m. NST S-4 ESTIMATION OF SHELL CHARACTERISTICS USING TIME-FREQUENCY PATTERNS AND NEURAL NETWORK
M.E. ZAKHARIA, P. CHEVRET and F. MAGAND, , LISA/LASSSO, 25, rue du Plat, 69288 Lyon cedex 02, FRANCE

12:00 noon NSP S-5 BLIND DECONVOLUTION OF ULTRASONIC SIGNALS THROUGH PARAMETRIC IDENTIFICATION USING SECOND AND FOURTH ORDER CUMULANTS
T. OLOFSSON and T. STEPINSKI Uppsala University, Department of Technology, Circuits and Systems, Box 534, S-751 21 Uppsala, Sweden

12:15 p.m. NPM S-6 MEASUREMENTS OF PULSE MODE BEHAVIOR IN UNCLAD AND WEAKLY-CLAD SILICA WAVEGUIDES
"Edward Verdonk, Hewlett-Packard Laboratories, Palo Alto, California 94303

11:00 a.m.	NSP	S-1	Performance Comparison of Time-Frequency Distributions for Ultrasonic Nondestructive Testing	M.A. Malik* and J. Saniee, Elect. and Computer Engr. Dept., Illinois Institute of Technology, Chicago, IL, *De Vry Inst. of Technology, Chicago, IL
11:15 a.m.	NMC	S-2	WAVELET IMAGE PROCESSING FOR WEAR AND EROSION MAPPING USING AN ULTRASONIC GAUGING TECHNIQUE	A. Abbate1 and J. Frankel1, Robert W. Reed2 and P. Das3 1 U.S. Army Tank-Automotive Armaments Command, Benet Laboratories, Watervliet, NY, 2 Physics Dept., East Stroudsburg University, PA, 3 RPI, NY
11:30 a.m.	NSP	S-3	Statistical Analysis of Split Spectrum Processing	Q. Tian and N. Bilgutay, ECE Dept., Drexel Univ., Philadelphia, PA
11:45 a.m.	NST	S-4	ESTIMATION OF SHELL CHARACTERISTICS USING TIME-FREQUENCY PATTERNS AND NEURAL NETWORK	M.E. ZAKHARIA, P. CHEVRET and F. MAGAND, , LISA/LASSSO, 25, rue du Plat, 69288 Lyon cedex 02, FRANCE
12:00 noon	NSP	S-5	BLIND DECONVOLUTION OF ULTRASONIC SIGNALS THROUGH PARAMETRIC IDENTIFICATION USING SECOND AND FOURTH ORDER CUMULANTS	T. OLOFSSON and T. STEPINSKI Uppsala University, Department of Technology, Circuits and Systems, Box 534, S-751 21 Uppsala, Sweden
12:15 p.m.	NPM	S-6	MEASUREMENTS OF PULSE MODE BEHAVIOR IN UNCLAD AND WEAKLY-CLAD SILICA WAVEGUIDES	"Edward Verdonk, Hewlett-Packard Laboratories, Palo Alto, California 94303

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